Microscopy of atomic forces – AFM (Atomic Force Microscopy) belongs to techniques of microscopy scanning by a probe, which are used for imaging structure of surfaces. It is based of mapping the distribution of atomic forces on the surface of the sample under investigation.AFMprovides a true to topographic three-dimensional picture of the surface with up to atomic discrimination. In addition to physics and chemistry of the surfaces the method is also applicable in biological disciplines. A special adjustment of the AFM scanner makes it possible to follow biological samples in liquid media. It makes it possible to exclude various artifacts caused by dehydration. The dention of human teeth is known to be excessively sensitive to dehydration and exsiccation, which is used the standard preparation of samples for the examination in SEM (Scanning Electron Microscopy). The paper describes our experience in the examination of the dentin surface in extracted third molars by means of AFM under wet conditions.

        Key words: Atomic Force Microscopy – dentin – smear layer